Contract Awards Details
Ref No 22009437
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International Competitive Bidding

Contract Details

Focused Ion Beam Scanning Electron Microscope System For Sample Preparation For Atom Probe Tomography Focused Ion Beam Scanning Electron Microscope System For Sample Preparation For Atom Probe Tomography

Funding Agency
Funding Agency European Union
Contract Completion *
Date 05 Feb 2026
* The estimated cost, values & dates are indicative only. Please read tender document for accurate information.
Client Address
Location Netherlands
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