Discover Tenders by Darkfield Scanning Probe Microscopes Sector

Find the most relevant tenders for Darkfield Scanning Probe Microscopes. Access the latest tender notices from various government and private organizations published across hundreds of websites and newspapers.Obtain complete and accurate information on Darkfield Scanning Probe Microscopes tenders, including all tender documents, RFPs, RFQs,and more. Utilize our advanced filters to search for Darkfield Scanning Probe Microscopes tenders by organization, tender value, opening and closing dates, and more.

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Nib 35 Ctvs Department 3 D Echo Machine Tee Probe

Deadline: 03 Feb 2026

India

Ref. No.: 24177508

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9 Days Left

Delivery Of An Agricultural Tractor Agricultural Machinery And Equipment Equipped With Agriculture 4 0 Solutions For The Production Of Basic Agricultural Products For Zsckr In Bystra Partial Task No 1 Delivery Of An Agricultural Tractor 80 90 Kw

Deadline: 20 Apr 2026

Poland

Ref. No.: 24176261

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85 Days Left

Supplies And Services Of Maintenance Products And Accessories For The Ville Grand Auch Coeur De Gascogne Gacg Order Group

Deadline: 27 Feb 2026

France

Ref. No.: 24175444

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33 Days Left

Inline Automatic Optical Inspection Aoi With High Speed Analysis For Qmi Systems

Deadline: 23 Feb 2026

Germany

Ref. No.: 24175302

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29 Days Left

Lcd Digital Probe Thermometer

Deadline: 05 Feb 2026

India

Ref. No.: 24175148

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11 Days Left

Basic Repair Of The Kachlet Weir Exploratory Drilling Of The Separation Mole Upstream

Deadline: 17 Feb 2026

Germany

Ref. No.: 24172564

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23 Days Left

Rental Purchase Of A Surgical Microscope With Intraoperative Oct

Deadline: 20 Feb 2026

Germany

Ref. No.: 24172173

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26 Days Left

All In One Pc V2 All In One Pc V2 Multifunction Printer Print Scan Copy

Deadline: 02 Feb 2026

India

Ref. No.: 24171373

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8 Days Left

Multi Purpose Developed Electron Microscope Sample Evaluation System Complete Set

Deadline: 05 Feb 2026

Japan

Ref. No.: 24170034

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11 Days Left

Multi Purpose Development Electron Microscope Data Analysis System Complete Set

Deadline: 05 Feb 2026

Japan

Ref. No.: 24170027

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11 Days Left

A Set Of Multi Purpose Development Electron Microscopes For Multi Object And Multi Layer Structure Analysis

Deadline: 05 Feb 2026

Japan

Ref. No.: 24169999

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11 Days Left

Probe Aberration Correction Atomic Resolution Analysis Cold Cathode Field Emission Scanning Transmission Electron Microscope System Complete Set

Deadline: 05 Feb 2026

Japan

Ref. No.: 24169895

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11 Days Left

A Set Of Modifications For Increasing The Output Of A 3D Submicron X Ray Microscope

Deadline: 05 Feb 2026

Japan

Ref. No.: 24169597

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11 Days Left

Bzp Szp 243 018 2026 Delivery Of A Differential Scanning Calorimeter Dsc 1 Piece For The Department Of Bioorganic Chemistry Of The Wroc aw University Of Science And Technology

Deadline: 20 Feb 2026

Poland

Ref. No.: 24169475

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26 Days Left

Framework Agreement For The Supply Of Sanitary Materials Medical Consumables Compatible 100 Or Equivalent With The Constellation Ophthalmological System Posterior Pole Vitrectomy Probe 25 Ga 7 500Cpm Compatible With Constellation

Deadline: 19 Apr 2026

Romania

Ref. No.: 24169284

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84 Days Left

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